Dr. C. J. Reddy, President
EM Software & Systems (USA) Inc.
Al Fresco, Newport News
6:30 PM, Thursday, 19 February 2009
Please RSVP to officers-r3-hamptonroads@ieee.org or on line at www.acteva.com.
| Al Fresco 11710 Jefferson Ave., #A Newport News, VA 23606 +1 757 873 0644 Directions | Agenda 6:00 PM Executive Committee 6:30 PM Social Period 7:00 PM Dinner 8:00 PM Technical Presentation | Meal Costs Members $20 Guests $20 Students $10 Technical presentation is FREE. |
Though Radio Frequency Identification (RFID) systems have been in use for various applications in the past, currently they are gaining popularity due to their application to retail supply chain management systems. Compared to low-frequency (LF) and high-frequency (HF) RFID systems (which operate through near-field inductive coupling and thus have relatively short read range), ultra high frequency (UHF) RFID systems operate through farfield backscattering, have larger read range, and have been widely used in supply chain management and inventory control. However, very often the electromagnetic (EM) performance of the reader/tag systems could be significantly degraded due to the complex physical environments. With the aid of computational electromagnetic (CEM) tools, such situations can be analyzed and optimized to improve the performance of RFID systems. This talk presents options for the EM characterization of such systems with the aid of full wave or hybrid numerical methods. Analysis of RFID tags, readers, tag placement, tag/reader coupling, and tag/reader systems in complex environments will be addressed.
Posts
No comments:
Post a Comment